In the LED, semi-conductor, automotive and medical sectors, surface metrology and characterization is an important criterion to ensure product performance in a wide range of applications. These ...
In response to the growing number of applications for electromechanical imaging and spectroscopy, Asylum Research offers the Piezo Force Module, which enables very-high-sensitivity, high-bias, and ...
A Photoconductive Atomic Force Microscopy (pcAFM) module is now available for the Bruker Dimension Icon platform. The module enables sample illumination while performing nanoscale electrical ...
The high-resolution imaging capability of atomic force microscopy (AFM) can be extended to enable a wide range of characterization methods to study electrical, mechanical, thermal, and other ...
JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces a new accessory for its NanoWizard® product line. The new conductive AFM module ...
(Nanowerk Application Note) Surface metrology and characterization is ever more critical for overall product performance in wide ranging applications across the semi-conductor, LED, data storage, ...
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